Joint Meeting

5 - 9 August 2019

The Westin Lombard Yorktown Center, Lombard, IL, USA

25th International Congress on X-Ray Optics and Microanalysis

68th Annual Denver X-ray Conference


Save the date: From August 5 to 9 2019 scientists will meet to discuss novel ground breaking synchrotron and laboratory X-ray spectrometry developments at one conference!

The ICXOM25, dedicated to developments in Synchrotron instrumentation and micro- and nano-analysis will be held together with the DXC specialized on newest developments and innovation in laboratory XRD and XRF in Lombard Illinois.

This conference series started in 1956 in Cambridge, UK, in response to the need for physical scientists, instrument developers and those using X-ray microscopes and electron probe analysers to come together every three (and now two) years to exchange experiences, learn about new developments in the field and gain new ideas for further research.

Following the trend of the last decade, the conference is focused on synchrotron radiation. Recent developments in laboratory instrumentation are also highly welcome. Besides micro-beam X-ray fluorescence and absorption spectroscopy, different methods based on diffraction and full-field imaging are covered, together with their applications in Life Sciences, Material Science, Earth and Environmental Sciences, and Cultural heritage.

Topics Include

  • Optics for Microanalysis
  • Scanning Microscopy
  • Full-field Imaging
  • Coherent Diffractive Imaging
  • Microdiffraction
  • X-ray Fluorescence
  • Absorption spectroscopy
  • Data Analysis
  • Detectors

This edition of ICXOM conference series will be held together with Denver X-ray conference. On Tuesday the sessions will be held at the Advanced Photon Source

Local Organizing Committee

  • Ursula Fittschen, (Clausthal University of Technology, DE)
  • Gerald Falkenberg (ICXOM22, 2013 Hamburg) (DESY, Hamburg, D)
  • Koen Janssens, (ICXOM15, 1998, Antwerp) (University of Antwerp, B)
  • Stefan Vogt, (Advanced Photon Source, Argonne National Laboratory, IL, US)
  • Christian Stoltenberg, (Clausthal University of Technology, DE)
  • Denise Zulli, (International Centre for Diffraction Data, US)

International Scientific and Advisory Committee

  • Koen Janssens, chair (ICXOM15, 1998, Antwerp) (University of Antwerp, B)
  • Peter Wobrauschek (ICXOM16, 2001, Vienna) (TUWien, A)
  • Alexandre Simionovici (ICXOM17, 2003, Chamonix) (U. Grenoble, F)
  • Sultan Dabagov (ICXOM18, 2005, Frascati) (LNFN, Frascati, I)
  • Shinjiro Hayakawa (ICXOM19, 2007, Kyoto) (University of Hiroshima, J)
  • Melissa Denecke (ICXOM20, 2009, Karlsruhe, D) (UMIST, Manchester, UK)
  • Carlos A. Pérez (ICXOM21, 2011 Campinas) (LNLS, Campinas, Br)
  • Gerald Falkenberg (ICXOM22, 2013 Hamburg) (DESY, Hamburg, D)
  • Juergen Thieme (ICXOM23, 2015 Brookhaven) (BNL, NY, USA)
  • Alessandra Gianoncelli (ICXOM24, 2017, Trieste) (ELETTRA, Trieste, I)

Previous Conferences

  • Sept. 2017, Trieste,Italy | ICXOM24
  • Sept. 2015, Brookhaven, NY, USA | ICXOM23
  • Sept. 2013, Hamburg, Germany | ICXOM22
  • Sept. 2011, Campinas, Brazil | ICXOM21

Tentative program:

Invited Speakers

  • Florian Meirer, University of Utrecht, NL
  • Björn de Samber, University of Ghent, BE
  • Hendrik Küpper, Czech Academy of Sciences, CZ
  • Frank Seiboth, DESY, DE
  • Adam Kubec, Paul Scherrer Institute, CH
  • Arthur Woll, Cornell University, US
  • Simon James, The Florey, AU
  • more to be anounced soon.


  • X-ray optics
  • New Detectors


  • SR nanoprobes


  • Multimodal imaging
  • Data analysis


  • Biological applications
  • Cultural Heritage
  • Environmental
  • Materials


Since this ICXOM conference will be held together with Denver X-ray conference, please use the DXC webpage to register.


The proceedings will be published in Powder Diffraction Journal in a special issue.